ToF-SIMS Researcher

You will be responsible of daily ToF-SIMS analysis and will conduct SIMS R&D activities

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The composition analysis team provides imec-wide support in materials characterization by means of secondary ion mass spectrometry (SIMS) using both Magnetic Sector (MS-SIMS) and Time-of-Flight (ToF-SIMS) instruments. As SIMS Researcher, you will be responsible of the daily ToF-SIMS measurements to support the fab demand, the different R&D activities within imec and the PhD student works. You will also be responsible of several R&D activities within the team such as developing new internal SIMS references, optimizing ToF-SIMS analysis conditions for specific requests, optimizing the measurements requiring the in-situ SPM (Scanning Probe Microscopy), GCIB (Gas Cluster Ion Beam) and/or FIB (Focused Ion Beam) modules of the ToF-SIMS instrument, .... 

• You are responsible of the daily ToF-SIMS analysis.
• You contribute, oversee and manage the execution, interpretation, and reporting of ToF-SIMS analyses, and you advise internal and external customers. 
• You document best practices and provide training to the team members.
• You contribute to the creation of a long-term vision and strategy for the group.
• You contribute to possible JDP s (Joint Development Program) and deliverables of funded research projects and programs.
• You contribute to conferences/workshops, generate patents and publish in international journals.
• You mentor Master internship students and PhD students.

The work will consist of experimental work, data analysis and interpretation, interaction with imec engineers/researchers and partners, and of literature studies. As part of the Materials and Component Analysis (MCA) department, it is expected that you gain knowledge in other characterization methods in the MCA department and in the fab, and that you correlate your results to other characterization methods and to the advanced process and device technology.